{"id":872,"date":"2025-02-25T22:16:54","date_gmt":"2025-02-25T22:16:54","guid":{"rendered":"https:\/\/www.adgsrl.com\/products\/omniscan-x3-series\/"},"modified":"2025-03-26T17:38:39","modified_gmt":"2025-03-26T17:38:39","slug":"omniscan-x3-series","status":"publish","type":"product","link":"https:\/\/www.adgsrl.com\/en\/products\/omniscan-x3-series\/","title":{"rendered":"OmniScan X3 Series"},"content":{"rendered":"\n
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EVIDENT<\/p>\n\n\n\n

OmniScan X3 Series<\/h2>\n\n\n\n

Each OmniScan\u2122 X3 series defect detector represents a complete phased array instrument. Innovative TFM and advanced PA capabilities facilitate reliable defect identification while powerful software tools and simplified workflows improve productivity. <\/p>\n\n\n\n

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Download brochure<\/a><\/div>\n\n\n\n
Contact us<\/a><\/div>\n<\/div>\n<\/div>\n<\/div>\n\n\n\n
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01<\/div>\n
Dimensions (Width \u00d7 Height \u00d7 Depth)<\/div>\n
335 mm \u00d7 221 mm \u00d7 151 mm<\/div>\n <\/div>\n
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02<\/div>\n
Weight<\/div>\n
5.7 kg (with 1 battery)<\/div>\n <\/div>\n
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03<\/div>\n
Internal memory<\/div>\n
64 GB SSD internal memory, expandable via an external USB key as needed<\/div>\n <\/div>\n
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04<\/div>\n
Storage media<\/div>\n
SDHC\u2122 and SDXC\u2122 cards or standard USB storage media<\/div>\n <\/div>\n
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05<\/div>\n
GPS<\/div>\n
Yes (unless specified otherwise in some areas)<\/div>\n <\/div>\n
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06<\/div>\n
Alarms<\/div>\n
3<\/div>\n <\/div>\n
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07<\/div>\n
Wireless connection<\/div>\n
Yes (USB holder sold separately as an accessory)<\/div>\n <\/div>\n
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08<\/div>\n
Connectors<\/div>\n
1 PA connector, 2 UT channels (2 P\/R connectors each)<\/div>\n <\/div>\n
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09<\/div>\n
Number of groups<\/div>\n
8 groups (16:128PR and 32:128PR); 16:64PR offers 2 groups (PA, UT or TFM) or 2PA + 1UT<\/div>\n <\/div>\n
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10<\/div>\n
Certification<\/div>\n
ISO 18563-1:2015 EN12668-1:2010<\/div>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n\n
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Highlights<\/p>\n\n\n\n

Why choose OmniScan X3 Series?<\/h2>\n\n\n\n
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01<\/div>\n
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Portable power<\/h4>\n
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The OmniScan X3 combines rugged, portable construction with advanced performance, delivering high-power focusing capabilities. The OmniScan Thanks to this optimized performance, complex inspections can be performed on materials of high thickness or attenuation, expanding the possibilities for developing new inspection procedures for a wider range of applications.<\/p>\n <\/div>\n <\/div>\n <\/div>\n <\/div>\n

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02<\/div>\n
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Visible reliability<\/h4>\n
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The OmniScan X3 flaw detector is a complete phased array instrument, designed to ensure reliable and precise inspections. The integration of advanced features, such as Total Focusing Method (TFM) imaging and advanced visualization, ensures high image quality, allowing you to complete every inspection with greater confidence and precision.<\/p>\n <\/div>\n <\/div>\n <\/div>\n <\/div>\n

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03<\/div>\n
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Instant confirmation of TFM beam coverage<\/h4>\n
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The Acoustic Influence Mapping (AIM) tool offers an at-a-glance visual model of beam sensitivity, based on the selected mode, configuration and simulated reflector. Thanks to AIM, it is possible to eliminate the subjective element in the creation of the scan plane, viewing the effect of the waves in real time in TFM mode. This allows you to identify sensitivity limits and adjust the scanning plane optimally, improving the reliability and effectiveness of inspections.<\/p>\n <\/div>\n <\/div>\n <\/div>\n <\/div>\n <\/div>\n

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01<\/div>\n
\n

Portable power<\/h4>\n
\n

The OmniScan X3 combines rugged, portable construction with advanced performance, delivering high-power focusing capabilities. The OmniScan Thanks to this optimized performance, complex inspections can be performed on materials of high thickness or attenuation, expanding the possibilities for developing new inspection procedures for a wider range of applications.<\/p>\n <\/div>\n <\/div>\n <\/div>\n

\n
02<\/div>\n
\n

Visible reliability<\/h4>\n
\n

The OmniScan X3 flaw detector is a complete phased array instrument, designed to ensure reliable and precise inspections. The integration of advanced features, such as Total Focusing Method (TFM) imaging and advanced visualization, ensures high image quality, allowing you to complete every inspection with greater confidence and precision.<\/p>\n <\/div>\n <\/div>\n <\/div>\n

\n
03<\/div>\n
\n

Instant confirmation of TFM beam coverage<\/h4>\n
\n

The Acoustic Influence Mapping (AIM) tool offers an at-a-glance visual model of beam sensitivity, based on the selected mode, configuration and simulated reflector. Thanks to AIM, it is possible to eliminate the subjective element in the creation of the scan plane, viewing the effect of the waves in real time in TFM mode. This allows you to identify sensitivity limits and adjust the scanning plane optimally, improving the reliability and effectiveness of inspections.<\/p>\n <\/div>\n <\/div>\n <\/div>\n <\/div>\n <\/div>\n\n <\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"

EVIDENT OmniScan X3 Series Each OmniScan\u2122 X3 series defect detector represents a complete phased array instrument. Innovative TFM and advanced PA capabilities facilitate reliable defect identification while powerful software tools and simplified workflows improve productivity. 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